Reliability improvement of self-heating effect, hot-carrier injection, and on-current variation by electrical/thermal co-design
- 주제(키워드) 도움말 Semiconductor reliability , Self -heating effect (SHE) , Hot-carrier injection (HCI) , On-current variation , Lightly doped drain (LDD)
- 발행기관 PERGAMON-ELSEVIER SCIENCE LTD
- 발행년도 2022
- 총서유형 Journal
- 본문언어 영어
