Low Power CMOS Image Sensors using Two-Step Single Slope ADC with Bandwidth-Limited Comparator and Voltage Range Extended Ramp Generator
- 발행기관 서강대학교 일반대학원
- 지도교수 범진욱
- 발행년도 2020
- 학위수여년월 2020. 2
- 학위명 박사
- 학과 및 전공 일반대학원 전자공학과
- UCI I804:11029-000000064956
- 본문언어 영어
- 저작권 서강대학교 논문은 저작권보호를 받습니다.
초록/요약
This paper proposes a low-power column-parallel Two-Step Single Slope Analog-to-Digital Converter (SS ADC) and voltage range tuned ramp generator for low-power CMOS Image Sensors (CIS). The proposed SS ADC has small bandwidth to drive the low power CMOS Image Sensors, without sacrificing the bandwidth performance. The ADC errors caused by the limited bandwidth can be resolved using dual CDS (Correlated Double Sampling) and using voltage range tuned ramp generator. The proposed Two-Step structure consists of a resistor DAC (coarse ramp) and a current DAC (fine ramp). The fine ramp has one slope generator, regardless of results of coarse ramp decisions, to remove the mismatch of slope between fine ramp slopes. This sensor of 960 × 720 pixels has been fabricated with 90 nm CMOS process. The measurement results demonstrate that proposed column parallel CDS circuits can achieve the current consumption is about 2 μA with 50MHz main clock frequency, which is less than 33 % of other reports. The frame rate of the proposed CMOS Image Sensors (CIS) is maximum 35 fps. The proposed circuit has a redundancy error correction logic for to calibrate error between coarse and fine conversions. Total power consumption 28 mW from supply voltages of 2.8 V (analog) and 1.5 V (digital).
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